EFFECT OF ZNO:B GROWTH TEMPERATURE DEPOSITED BY MOCVD TECHNIQUE ON FILM
PROPERTIES AND THIN FILM SILICON SOLAR CELLS PERFORMANCE
J. Sritharathikhun, P. Krudtad, S. Songtrai, A. Moollakorn, A. Limmanee and K. Sriprapha
Institute of Solar Energy Technology Development, National Science and Technology Development Agency
111 Thailand Science Park, Paholyothin Rd., Klong Nueng, Klong Luang, Pathumthani 12120 THAILAND
Tel. +66 2564 7000 Ext. 2711, Fax. +66 2564 7059, E-mail: jaran@nstda.or.th
ABSTRACT: Boron doped Zinc Oxide (ZnO:B) films were deposited at various growth temperatures (120 – 240°C)
by the Metal Organic Chemical Vapor Deposition (MOCVD) technique. The gas mixture of Diethyzinc (DEZ) and
water (H2O) was used as reactant gas while Diborane (B2H6) was employed as the n-type doping gas. In this paper,
the properties of ZnO:B film were investigated by Scanning Electron Microscopy (SEM), Hall’s measurement, step
profile and UV/Visible Spectrometer with integrating sphere. It was found that, at the substrate temperature of about
210°C, ZnO:B film showed the carrier concentration, mobility, and resistivity of 4.0x1019 cm-3, 34.4 cm2v-1s-1, and
5.0x10-3 Ωcm, respectively. The total transmittance tended to decrease, while the grain size of the ZnO:B became
lager with increasing substrate temperature. The effects of the growth temperatures of ZnO:B coated glass on the
performance of thin film amorphous silicon solar cells were carried out with a structure of glass/MOCVD ZnO (2
µm) / p-µc-Si:H (20 nm) / i-a-Si:H (350 nm) / n-µc-Si:H (30 nm) / ZnO (80 nm) / Ag and an effective area of 0.73
cm2. The best solar cell was achieved at MOCVD ZnO:B growth temperature of 180ºC with VOC as high as 0.94 V,
JSC of 13.8 mA/cm2, FF of 0.68, and efficiency of 8.7%.
Keywords: Transparent conducting oxides, ZnO, thin film solar cell
1 INTRODUCTION
Among the transparent conductive oxide (TCO)
glasses such as Indium Tin Oxide (ITO), Tin Oxide
(SnO2), and Zinc Oxide (ZnO), ZnO film is one of the
most promising candidate materials for an application in
thin film silicon solar cells. Compared to ITO and SnO2
materials prepared by chemical vapor deposition, the cost
of ZnO is the cheapest [1]. Normally, ZnO can be used in
three parts of thin film solar cells. ZnO coated glass
substrate shows higher stability under relatively
aggressive device fabrication processes like high
hydrogen dilution plasma [2]. ZnO intermediate reflector
can enhance short-circuit current of top cell in tandem
cell [3]. And ZnO film can be applied as a back reflector
of the solar cells to improve its optical properties [4] and
also has advantage of preventing the diffusion of metal
atoms at the contact. Recently, Metal Organic Chemical
Vapor Deposition (MOCVD) technique has attracted
much attention [4,5] since this technique can deposit film
in large area, and shows benefits of low cost and easily
controllable film properties by changing deposition
parameters.
In this paper, we have investigated the effect of
growth temperature on the structural, electrical, and
optical properties of ZnO:B films by using Hall
measurement, scanning electron microscopy (SEM), Step
Profiler and UV/Visible Spectrometer with integrating
sphere. The effect of growth temperature of ZnO:B
coated glass on the solar cells performance were also
carried out.
2 EXPERIMENTAL DETAILS
2.1 Preparation of ZnO:B with various growth
temperature
ZnO:B films were prepared by MOCVD technique
on soda lime glass. The gas mixture of Diethyzinc (DEZ)
and water (H2O) was used as reactant gas while Diborane
(B2H6 0.1% in H2 dilution) was employed as the n-type
doping gas. The deposition condition was shown in Table
I. The [DEZ]/[H2O] flow rate was fixed at 40/80 sccm
while B2H6 flow rate was fixed at 15 sccm. The
deposition pressure and the thickness of the ZnO:B film
were kept at 300 mTorr, and 2.0 µm, respectively. In
order to investigated the effect of growth temperature on
the ZnO:B film properties, the substrate temperatures
were varied from 100-240ºC. The carrier concentrations,
resistivity and electron mobility of the ZnO:B films were
determined by Hall measurement using the Van der Pauw
configuration. Scanning Electron Microscopy (SEM) was
used to characterize the surface morphology of the
ZnO:B films. The transparency and haze were evaluated
from UV/Visible Spectrometer with integrating sphere at
wavelength range from 350 to 1100 nm. The film
thickness was measured by a step profiler.
Table I: Deposition parameters of ZnO:B film
DEZ/H2O/B2H6 ratio : 40/80/15
Deposition temperature : 120-240°C
Deposition pressure : 0.3 Torr
Gap distance : 0.5 cm
Film Thickness : 2 µm
(* B2H6 0.1% in H2)
2.2 Fabrication of thin film amorphous silicon solar cells
on ZnO:B substrate
The thin film silicon solar cells with a structure of
glass/ MOCVD ZnO:B/ p-μc-SiO:H/ i-a-Si:H/ n-μc-Si:H/
ZnO/ Ag were fabricated in order to investigate the
effects of the ZnO:B films growth temperature on the
characteristics (performance and quantum efficiency) of
solar cells. Thin film silicon solar cell was deposited by
very high frequency plasma enhanced chemical vapor
deposition (60 MHz VHF-PECVD) using a gas mixture
of SiH4, H2 and CO2, whereas PH3 and TMB+B2H6 were
employed as dopant gases for n and p type films,
respectively. Laser scribing was carried out to divide the
active area of the solar cells into 0.73 cm2. Photo current
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voltage (I-V) measurement of solar cells was performed
under AM1.5 condition, 100 mW/cm2 at a temperature of
25°C.
3 RESULTS AND DISCUSSIONS
3.1 Structural, electrical and optical properties of ZnO:B
film
Figure 1 showed the morphology of ZnO:B films
with growth temperature range from 120 to 240ºC by
SEM. It was found that crystalline grain size of the
ZnO:B films increased with increasing growth
temperature, a dominant orientation were changed from
(002) to (110) plane leading to an increase in Haze value
(Fig. 2). According to results shown in Fig. 2, we found
that the growth temperature significantly affected
resistivity, mobility, and carrier concentration of the
ZnO:B films. With the increase of growth temperature
from 120 to 240ºC, the resistivity of ZnO:B film
decreased from 1.5x10-2 to 5.0x10-3 Ω cm due to an
increase of crystalline phase of these films as shown in
Fig.1 and then increased at the temperature above 210ºC
due to a decrease in mobility.
Mobility increased gradually with an increase of
growth temperature since 120ºC and reached the
maximum value of 34 cm2v-1s-1 at the growth
temperature of 210ºC, then dropped at the higher
temperature. On the other hand, the carrier concentration
tended to increase continuously over the observed
temperature range. The total and diffuse transmittance of
ZnO:B films was shown in Fig. 3. We found that the total
transmittance of ZnO:B films was decreased with
increasing growth temperature while diffuse
transmittance was increased leading to an increase of
haze value in Fig. 2.
Figure 1 (a-e) SEM picture of ZnO:B films deposited
with various growth temperature
Figure 2 Resistivity, mobility, aarrier density and haze
value of ZnO:B films as a function of ZnO:B film growth
temperature
400 500 600 700 800 900 1000 1100
0
10
20
30
40
50
60
70
80
90
100
400 500 600 700 800 900 1000 1100
0
10
20
30
40
50
60
70
80
90
100
Wavelength(nm)
Diffuse transmittance
Tr
an
sm
itt
an
ce
(%
)
Temp 120oC
Temp 150oC
Temp 180oC
Temp 210oC
Temp 240oC
Total transmittance
(a) 120ºC (b) 150ºC (c) 180ºC
(d) 210ºC (e) 240ºC
Figure 3 Total and diffuse transmittance of ZnO:B films
deposited with various growth temperature
3.2 Fabrication of thin film amorphous silicon solar cells
using MOCVD ZnO:B substrate
First, we fabricated a thin film silicon solar cell by
using MOCVD ZnO:B coated glass as a substrate. The
structure of the solar cell was glass/MOCVD ZnO:B (2
µm)/p-µc-Si:H (20 nm)/i-a-Si:H (350 nm)/n-µc-Si:H (30
nm)/ZnO (80 nm)/Ag with an effective area of 0.73 cm2.
In order to investigate the effect of ZnO:B growth
temperature on the solar cell performance, we changed
the growth substrate from 120 to 240ºC, and kept the
thicknesses of the ZnO:B layers at 2 µm.
Figure 4 shows the photovoltaic parameters of the
solar cells using ZnO:B substrate with various growth
temperature. When the growth temperature increased,
Voc, JSC as well as FF increased up to the temperature of
180ºC. Enhancement of the FF was supposed to be due to
the reduction of the electrical resistivity of the ZnO:B
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films. However, FF and JSC decreased at the temperature
above 180ºC. This might be due to deterioration of the
thin p layer by textured ZnO:B with large grain size.
Figure 5 shows the quantum efficiencies of thin film
amorphous silicon solar cells as a function of ZnO:B film
growth temperature. The enhancement in the JSC was
obtained upto temperature of 180ºC due to an increase of
haze value leading to the improvement of light scattering
of ZnO:B coated glass. However, the JSC decreased at the
ZnO:B growth temperature above 180ºC, where the film
showed relatively low total transmittance. Further
optimization of deposition conditions and surface
texturing of the ZnO:B films are expected to improve
solar cell performance.
Figure 4 Photovoltaic parameters of thin film amorphous
silicon solar cells as a function of ZnO:B film growth
temperature.
400 500 600 700 800
0.0
0.2
0.4
0.6
0.8
1.0
Q
ua
nt
um
e
ffi
ci
en
cy
(Q
E)
Wavelength (nm)
120°C
150°C
180°C
210°C
240°C
Figure 5 Quantum efficiencies of thin film amorphous
silicon solar cells with various of ZnO:B film growth
temperature.
4 CONCLUSIONS
In this study, the ZnO:B film was prepared by
MOCVD technique. The effects of growth temperature
on the structural, electrical and optical properties of
ZnO:B films were investigated. With an increasing of
growth temperature, crystalline grain size increased.
The lowest resistivity of 5.0x10-3 Ωcm was obtained
from the growth at 210ºC with carrier concentration and
mobility of 4.0x1019 cm-3 and 34.4 cm2v-1s-1,
respectively. The best solar cell was achieved at
MOCVD ZnO:B growth temperature of 180ºC with VOC
as high as 0.94 V, JSC of 13.8 mA/cm2, FF of 0.68, and
efficiency of 8.7%.
ACKNOWLEDGEMENT
This work was supported by Cluster and Program
Management Office (CPMO) of NSTDA, Thailand
References
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[3] J. Muller, B. Rech, J. springer, M. Vanecek, Sol.
Energy. 77 (2004) 917.
[4] X. L. Chen, B. H. Xu, Y. Zhao, C. C. Wei, J. Sun, Y.
Wang, X. D. Zhang, X. H. Geng, Thin Solid Films. 515
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[5] W. W. Wenas, A. Yamada, and K. Takahashi, J.
Appl. Phys.70 (11) (1991) 7119.
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