EIA
STANDARD
ANSI/EIA-541-1988
. APPROVED: JUNE 24, 1988
Packaging Material Standards for
ESD Sensitive Items
EIA-541
(Revision of EIA/IS-5-A)
JUNE 1988
ELECTRONIC INDUSTRIES ASSOCIATION
ENGINEERING DEPARTMENT
. . .
E I A 541 88 m 3234600 0074597 2 m ' .
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NOTICE
EIA Engineering Standards and Publications are designed t o serve the public
interest through eliminating misunderstandings between manufacturers and
purchasers, facilitating interchangeability and improvement of products, and
assisting the purchaser in selecting and obtaining with minimum delay the
proper product for his particular need. Existence of such Standards and Pub-
lications shall not in any respect preclude any member or non-member of EIA
from manufacturing or sell ing products not conforming to such Standards and
Publications, nor shall the existence of such Standards and Publications preclude
their voluntary use by those other than EIA members, whether the standard i s
t o be used either domestically or internationally.
Recommended Standards and Publications are adopted by EIA without regard t o
whether or not their adoption may involve patents on articles, materials, o r .
processes. By such action, EIA does not assume any l iab i l i ty to any patent owner,
nor does it assume any obligation whatever to parties adopting the Kecom-
mended Standard or Publication.
This EIA Recommended Standard is considered to have international stan-
dardization implications, but the IEC activity has not progressed to the
point where a valid comparison between the EIA Recommended Standard and
the IEC Recommendation can be made.
Published by
ELECTRONIC INDUSTRIES ASSOCIATION
Engineering Department
2001 Eye Street, N.W.
Washington, D.C. 20006
Copyright 1988
All rights' reserved
ELECTRONIC INDUSTRIES ASSOCIATION
PRICE: $22.00
Printed in U.S.A.
P
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APPENDIX
A
B
C
D
E
F
G
Al.
B a .
E l
E 2
E 2
G 1
G 2
TRIB0EL;ECTRIC TESTING OF
PACKAGING MATERIAbs
PAGES
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2. DEFINmroNS
2.1 Rchging Materials
Those materials which cushion, enclose or protect the finished
product during transportation and storage, such as: bags, boxes,
wrap, cushiohing materials, forms and magazines (i.e., slides,
tubes, or rails).
2.2.1 Antistatic praperty
For purposes of this standard, those materials exhibiting
antistatic proprties are those which minimize the charge
when rubbed against or separated frum t h d v e s or other
similar materials. The degree of charge generation will
then be de-ent upon the specific materials bolved.
Tests such as those specified in woes B, C, or D
should be performed to determine the level of charge
generation for specific conkhations of materials.
Antistatic praperties may be present or impartea to
materials in any of the follmhg ways:
2.2.1.1 Bulk Treatment
Those materials with additives which minimize
charge generation.
2.2'1.2 Surface Treatment
Those materials which have been treatzedby spraying,
dipping, printing, or wiphg with a topical additive.
2.2.1.3 Intrinsic S t a t e
mose materials which naturally exhibit the
charachristic without additional additives or
treatment.
Those materials which are capable of attematingan
electmstatic field, so that its effects do not reach
the stored or contained items andproducedamage. An
electmstatic shield material shall have a conductive
la er with a surface resistivity of less than 1. O x
10 x 0
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c&q~~/square, or a volume resistivity of less than 1.0 X
10 ohna. Iper millimeter of thickness.
m&&ive mteriäls may be defined as being either
surface conductive or volume conductive but the two are
not necessarily intemelated. These materials are
either mal or impresMtea w i t h metal, carbon particles
or other amlc t ive materials, or whose surface has been
treaW with su& materials through a process of
lacquering, platirq, metallizing, or printing. A
cxnc.h&ive mk~ia l is not necessarily antistatic. A
surface anductive material shall have a surface
vohme cxm&ive material p l have a volume
m i ~ t ~ t y of ISS than 1.0 X lo5 ahms/sq~are. A
3resistivi%p of %f3S than 1.0 x 10 ohm-cm.
me paaging materid nust maintain its antistatic and/or
resistivity properties during storage, shipment, distribution,
application or use and to the point of either reuse or dispmal at
the user’s pint.
Spne test lot shall. be conditioned a t 12% f3% relative humidity and
23O +3C €or a minimum of 48 h m . All specimens shall also be
tested i n W s same environment, w p r s e d q the test condition of
m y and all mfamM d”.
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f
special properties such as &emial cormsion, outgassitq, sloughing
of particulate matter, allergic reactions, dielectric strength, grid
size, and others are outside the saope of this .document. H c w v e r ,
where applicable for a specific use, these should be given
consideration.
Also, it should be noted that in performing solllbe of the material
verification tests called for in this docxrment, high voltages may be
encountered. C a m should be exercised to prevent i n j q f m
accidental contact with these voltages.
4. SPECIFIC TECHNICAL
4 . 1 Magazines (Slides, Tubes, Flails)
4.1.1. Antistatic €?mpe&y
4.1.1.1
4.1.1.2
mstiIKJ Method
Magazines shall be tested for tribcelectric
US- the Faraday CUp Test in A3rpendix B.
Identification
Magazines that are treated with antistatic agents shall
be identified as Ilantistat t r e a t e d t 1 by marking,
embossing, printing, labeling, or other suitablemeans
to prevent use of other similar but non-antistatic
magazines where antistatic properti& are desired. They
shall be mrkd with the manufacturerls name. L#t llumber
or date of manufacture shall also appar (month and
year, e.g., 12/86)
4.1.2 Resistivity Praperty
4.1.2.1 Material Fbqùmmmts
Electrostatic shieldbq types shall:
1. Have a of less than 3 x 105
ckrms per meter of length, with the shielding surface
not necessarily exposed, or
2. Have a shielding la er with a surface resistivity of
AsTM-D-257 or equivalent, or otherwise determined,
or
less than 1 x lox akrms/square as wasured per
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3. ve a VOIW resistivity of less than 1. O x lo3
ohmm per millht@r of thickness as measured per
XT"D-991 or AS1M-D-257 as appropriate.
N m : The values given abave are based upon a
continuclszs shielding material and may vary for
~Mmed magazines or magazines with open areas.
4.1.2.2 I d e n t i f i ~ t i o n
mese magazines shall be inclividually identified as
%ÇD skiddingfo marking, embossing, printing,
labeling, or other suitable means to prevent use of
&er sinrilm bart mn-electmstatic shielding
materials where electrostatic shielding properties
m a n u f a w f s name. m rnrmber or date of
are desi.red. They shall be marked with the
4.2 Bags and -ches ( N o n a o m )
4.2.1 Antistatic
materiale shall be evaluated for trikdectric
chaqing us: G. As apprapriate additimal
evaluation may ke ~ X C ~ Q Z - A E ~ wing C.
O
4.2.1.2 Idmtzification
Bags and puches that are treated with antistatic agents
shall be individually identified as Ifantistat t r e a t e d 1 1
by marking, embsshg, printing, labeling or other
suitable means to prevent use of other similar but
non-antistatic bags and pauches where antistatic
properties are desired. Antistatic materials shall be
marked with the mnufacturerls name. rnrmber or date
of manufacture shall also alJpear (mnth and year, e.g. ,
12/86) o
m e shielding layer shall be electrically
eontimaus and shall conform to the criteria in
paragraph 2.2.2.1 except that volume conductive
materiab shall have a volume resistivity of
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A method for evaluating the relative prfomance
of an electmstatic-shielding type finished
is given in Appendh E.
4.2.2.2 Conductive Types
4.2.2.2.1 Material Require;ments
Materials which are o d y surface conductive
shall have a surface resistivity of less than
accordance with ASI"b257 or equivalent.
Volume conductive materials shall have a volume
resistivity less than 1. O x 104 ahmm per
millimeter of thicdcness &en measured in
accordance with As?M-E991 or equivalent.
1.0 X 105 -1- &en measured in
4.2.2.3 Dissipative Types
4.2.2.3.1 Material Requirements
Materials which a m only surface conductive
shall have a surface resistivity of at least 1
okrmS/- when mesured in accordance with
ASI"D-257 or equivalent. Volume coriiuctive
materials shall hye a volume resistivity of at
least 1.0 x 10 o l m l - c m . per lhter of
millbter of thiw when meafllred in
accordance with As?M-E991, or equivalent.
X lo5 m less than 1 x 10 i?
4.2.2.4 Identification
Electmstatic shielding, coactive, or dissipative
types shall be individually identified as I1ESD
respecrtively, by marking, embossing, printing, labeling,
or other similar means where such properties are desirea
in order to prevent use of other similar materials which
do not have these prcrperties. Materials shall be marked
with the mufacturer's name. I;ot nrrmber or date of
manufacrture shall. also a- (month and year e.g.,
shielding", llconductivel~, or lldissipativetl,
12/86) .
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static decay testing may also be perform3 as described
in Appendix F. H c w w e r , Static decay testing is in
addition t o t and not a substitute for, resistivity
meammmnb or Faraday cbp Tests.
Idmtffication sf this material shall be as specified in
Paragraph 4 0 1 . L 2 , when inpracticable because of
sane inherent. pmprty or configuration of the
shall a- the material indicating its date of
mufacture.
m*id. In such cases, a certificate of cmpliance
4.3 .2 .1 El-btie Shidding Type (Used as an Enclosure Only)
4.3 .2 .1 .1 Naterial Rqxhments
me electrostatic shielding performance of this
material shall be evaluated according to
”ph 4.2.2.1.1.
Materials which are only surface conductive
shall have a surface resistivity of less than
a c c o n with ASI”W257 or equivalent.
Vduw conductive materials shall ve a volume
resistivity of less than 1. O x 10 31” ohm-cm when
measwed in accordance with --W991 or
equivalent with the calculation based on the
unmmpmssed thickness of the material.
1 . 0 x lo5 clhms/square when meafllred in
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4.3.2.3 Dissipative Type
4.3.2.3.1 Material IWpimmnts
Materials which are only surface conductive
shall have a surface resistivity of at least 1
ohw/square when meafl;cred in accor-dance with
ASTM-D-257 or equivalent. Voluw conductive
materials shall have a volume resistivity of at
m in accomwith
m - E 9 9 1 or equivalent with the calculation
based on the unccanp-sed thidmess of the
material.
X 105 ohms/- m t less than 1.0 X 10 i%
1.0 X lo4 ohm- k t ~CSS than 1.0 X
4 3.2.4 Identification
Identification shall be the same as paragraph 4.2.2.4,
except when inpracticable because of sane inherent
property or configuration of the material. In such
cases, a certificate of compliance shall acccanpany the
material Mcating its date of marmfacrh;lre.
4.3.3.1 Testing Method
Static decay testing may also be perfonred as described
in m F. mer, static decay testing is in
addition to, and & a substitute for, resistivity
measurementS or Faraday Cup Tests. '
4.3.3.2 Limitations
See F, paragraph F3.0.
4.4.1.1 Material Requhamts
llrese materials shall be evaluated as specified in
C or D.
4.4.1.2 Identification
Identification of this material shall be as specified in
Paragraph 4.1. l. 2, except when impracticable because of
scane inherent property or. configuration of the
material. III such cases, a certificate of compliance
shall acccPnpany the material indicating its date of
mnufacture.
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mese material mqutmmnts shall be as
qecified in Paragraph 4.3.2.1.1.
mese xn&eri&S mpiremnts shall be as
q ~ ~ f f i e d in Paragraph 4.3.2.2.1.
Static decay testing may also be performed as described
addition to, and not a substitute for, resistivity
-ts or Faraday Cup Tests.
inAppen&k F. Hawever , Static decay testing is in
4.4.3.2 Limitations
4.5.1.1 Material EkqwhmmtS
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4.5. l. 2 Identification
Identification of this material shall be as specified in
Paragraph 4 . 1.1.2, except when impracticable because of
som inherent property or configuration of the
material. III such cases, a certificate of compliance
shall accmpany the material indicating its
mufacture.
4.5.2 Resistivity praperty
4.5.2.1 Conductive Types
4.5.2.1.1 Material Requhmmb
mese material nquhmmts shall
specified in Paragraph 4.3.2.2.1.
4.5 2.2 Dissipkive T y p s
4.5.2.2.1 Matexial -ts
These material z e q u i m m t s shall
specified in Paragram 4.3.2.3.1.
4.5.2.3 Identification
date of
be
be
as
as
Identification of these materials shall be the same as
Paragraph 4.2.2.4, acept when inpracticable because of
inherent praperty or configuration of the
material. In such cases, a certificate of conpliame
shall acccgllpany the material indicating its date of
manufacture.
4.6 Rigid Foams, Larye Molded, and other Similar Materials (All Types)
Materials shall meet the requimrmts of 4.3 or 4.5 as appropriate.
In sane applications, the central (or interior) part of the material
may be expcwd or used. In these cases, it is amropriate to take
specimens frcan both the skin and the interior to determine the
electrid pmperties.
4.7 Carrier Foam, .Lead Insertion Foam
4.7.1 Antistatic Property
4.7.1.1 Material Reqdmmnts
These materials shall be evaluated as specified in
Apgmdix C or D.
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4.7.1.2 Identification
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Identification of this materid shall be as specified in
Rm~graph 4.1. l. 2, except when impracticable because of
sane inherent property or configuration of the
materia%. In such cases, a certificate of compliance
-1 acxzcmpmy the anaterid indicating its date of
mmufactmee
4.7.2 Resistivity 3?mprty
Static decay testing may also be performed as described
in F. H“, static decay testing is in
addition to, and not a substitute for, resistivity
-lx or Faraday Cup Tests.
4.7.3.2 Limitations
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Antistat,
Antistatic
Agent
Antistatic
property
capacitance
Carrier
Qlarge
Practical unit of el-cal curnent. One ampere of
current is 6.24 x 10 electrons passing one point
second: 1 A = 1 c/s.
in one secod. oneampereequals onecaulcanbper
A = a m p e r e c = CcRPlcanb S = second
A chemical ccanpaund which, when impresMtea i n or
topically applied to a primary material or substrate
renders the primary material antistatic.
This praperty refers to the pwention of
triboelectric charge generation. It w i l l
effectively minimize the production of a static
charye when materials are separated frcgnamther
surface. This pmrcrperty is not a depexfient function
of material resistivity or of static decay performance.
A preformed container made of flexible material
generally enclosed on all sides except one which
foms an c p n i ~ ~ ~ that may or may not be sealed after
loading. It is m&ly constructed frcgn one piece
of material that has been folded wer and sealed on
two edges, or fm tubing sealed at one end.
The ability of a CCBlTponent or material to store an
electric charye. 'Ihe self-capzicitance of a charyed
conductor is the ratio of its charye to its voltage
(i.e., C = m) when all conductom are
!the ratio aepenaS on the voltage of
nearby conduhrs. Qpacitance is measured in units
of farads. Since a farad is such avexy larye
cpntity, its values are usually expressed in
millionths of a farad, or microfarads, and
millionths of millionths of a farad, or picofarads.
Holder for elecrtronic parts and devices which
facilitates handling during processing, production,
inprinting, or t e s t i q aperations and protects such parts-transport.
Meamred in caulcanbs or fractions t h m f . The
static charge on a body is measured by the nmbr of
separated electmns on thebody. Sincenet charye
cannot be created or destmyed, an electron remved
frcgn one bodty must go to anather body, leaving
behind a positive (+) void. Thus, there are always
equal and apposite c;harges P&&.
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A surfam =khat is eleckically confiuctive in that
mrrent can be passed as the result of an applied
voltage between any .two points on its Mysical
surface and when discontinuities, slots, or holes do
not mxpy more than 10% of the materialls surface.
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EMI
Faraday Cage
Ground
Grounding
Abbrwiation for eleckmmgnetic interference.
sources sparks, lightning, radar, radio andm
transmission, brush motors, line transients, etc. A
spark fram a static disdmge is a source of EMI.
By line conduction or air prcrpagation, can
inauce undesirable voltage signals in electronic
@ p t causing malfunction and occasionally
canpnent damage. Protection against ElMI usually
requires the use of shields, filters, and special
cimxit design.
E l e c t r i c a l energy is measured in watt-seconds or
joules. Sam semico&ctors can bedamgedbya
static discharge of less than one microjoule.
E l W t a t i
relations d / 2 , = or w/2.
is calculated from the
An electrically continucus, conductive enclosure
which pravides electrostatic shielding; that is, a
region of m electmstatic field. The cage or
shield is usually gmunded, although it need not be.
A metallic connection w i t h the earth to establish
zero potential or voltage- w i t h respect to graund or
earth. It is the voltage reference point in a
connection to earth, but it is understood that a
point in the circuit said to be at grCrund potential
could be mnnected t o e a r t h w i t h o u t disturbingthe
aperation of the circuit in any way.
circuit. There may or may ncrt be an actual
Graunds that can be used for’ static control work
stations include metal, water pipes, any pawer
graund, any large metal structural member of a
building, vessel hull, etc.
cbnnecrting to groclnd or to a cm3uctor that is
grrxuded. A meahã of referencing all conductive
&jects to a zero voltage equiputential surface.
This is the surest method of eliminating ESD since
eveqthing is maintained a t the same potential.
Insulator A material that is a poor conductor of electricity.
Inthte Packagirq mose materials in direct contact w i t h the item
Material Packaged.
Ionization !the process by which a neutral atam or molecule,
such as air, acquires a positive or negative
-e*
e
Nonconductor
O h
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Those pxzkagim~ mterials that do not cam in
packaged , or a m autsi