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EIA_541Packaging Material Standards for ESD Sensitive Items

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EIA_541Packaging Material Standards for ESD Sensitive Items EIA STANDARD ANSI/EIA-541-1988 . APPROVED: JUNE 24, 1988 Packaging Material Standards for ESD Sensitive Items EIA-541 (Revision of EIA/IS-5-A) JUNE 1988 ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT . . . E I A 541 88 m 3234600...
EIA_541Packaging Material Standards for ESD Sensitive Items
EIA STANDARD ANSI/EIA-541-1988 . APPROVED: JUNE 24, 1988 Packaging Material Standards for ESD Sensitive Items EIA-541 (Revision of EIA/IS-5-A) JUNE 1988 ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT . . . E I A 541 88 m 3234600 0074597 2 m ' . I U NOTICE EIA Engineering Standards and Publications are designed t o serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Pub- lications shall not in any respect preclude any member or non-member of EIA from manufacturing or sell ing products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than EIA members, whether the standard i s t o be used either domestically or internationally. Recommended Standards and Publications are adopted by EIA without regard t o whether or not their adoption may involve patents on articles, materials, o r . processes. By such action, EIA does not assume any l iab i l i ty to any patent owner, nor does it assume any obligation whatever to parties adopting the Kecom- mended Standard or Publication. This EIA Recommended Standard is considered to have international stan- dardization implications, but the IEC activity has not progressed to the point where a valid comparison between the EIA Recommended Standard and the IEC Recommendation can be made. Published by ELECTRONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Eye Street, N.W. Washington, D.C. 20006 Copyright 1988 All rights' reserved ELECTRONIC INDUSTRIES ASSOCIATION PRICE: $22.00 Printed in U.S.A. P E I A 541 88 3234b00 0074598 4 Em-541 3 . 4 . 4.3. 4.2 4.3 4.4 4.5 4.6 4.7 PAGES 1 2 2 2 3 3 3 4 4 4 5 7 8 9 10 10 i EIA 5 4 1 88 m 3234600 0074599 b m I I EIA-541 APPENDIX A B C D E F G Al. B a . E l E 2 E 2 G 1 G 2 TRIB0EL;ECTRIC TESTING OF PACKAGING MATERIAbs PAGES 12 20 25 28 29 33 38 19 24 31 31 37 43 44 iì E I A 541 88 3234600 0074b00 9 m EIA-541 Page 1 EIA-541 Fage 2 2. DEFINmroNS 2.1 Rchging Materials Those materials which cushion, enclose or protect the finished product during transportation and storage, such as: bags, boxes, wrap, cushiohing materials, forms and magazines (i.e., slides, tubes, or rails). 2.2.1 Antistatic praperty For purposes of this standard, those materials exhibiting antistatic proprties are those which minimize the charge when rubbed against or separated frum t h d v e s or other similar materials. The degree of charge generation will then be de-ent upon the specific materials bolved. Tests such as those specified in woes B, C, or D should be performed to determine the level of charge generation for specific conkhations of materials. Antistatic praperties may be present or impartea to materials in any of the follmhg ways: 2.2.1.1 Bulk Treatment Those materials with additives which minimize charge generation. 2.2'1.2 Surface Treatment Those materials which have been treatzedby spraying, dipping, printing, or wiphg with a topical additive. 2.2.1.3 Intrinsic S t a t e mose materials which naturally exhibit the charachristic without additional additives or treatment. Those materials which are capable of attematingan electmstatic field, so that its effects do not reach the stored or contained items andproducedamage. An electmstatic shield material shall have a conductive la er with a surface resistivity of less than 1. O x 10 x 0 EIA 541 88 m 3234600 0074b02 2 m EIA-541 Page 3 c&q~~/square, or a volume resistivity of less than 1.0 X 10 ohna. Iper millimeter of thickness. m&&ive mteriäls may be defined as being either surface conductive or volume conductive but the two are not necessarily intemelated. These materials are either mal or impresMtea w i t h metal, carbon particles or other amlc t ive materials, or whose surface has been treaW with su& materials through a process of lacquering, platirq, metallizing, or printing. A cxnc.h&ive mk~ia l is not necessarily antistatic. A surface anductive material shall have a surface vohme cxm&ive material p l have a volume m i ~ t ~ t y of ISS than 1.0 X lo5 ahms/sq~are. A 3resistivi%p of %f3S than 1.0 x 10 ohm-cm. me paaging materid nust maintain its antistatic and/or resistivity properties during storage, shipment, distribution, application or use and to the point of either reuse or dispmal at the user’s pint. Spne test lot shall. be conditioned a t 12% f3% relative humidity and 23O +3C €or a minimum of 48 h m . All specimens shall also be tested i n W s same environment, w p r s e d q the test condition of m y and all mfamM d”. E I A 541 88 m 3234600 0074603 4 m EIA-541 Page 4 f special properties such as &emial cormsion, outgassitq, sloughing of particulate matter, allergic reactions, dielectric strength, grid size, and others are outside the saope of this .document. H c w v e r , where applicable for a specific use, these should be given consideration. Also, it should be noted that in performing solllbe of the material verification tests called for in this docxrment, high voltages may be encountered. C a m should be exercised to prevent i n j q f m accidental contact with these voltages. 4. SPECIFIC TECHNICAL 4 . 1 Magazines (Slides, Tubes, Flails) 4.1.1. Antistatic €?mpe&y 4.1.1.1 4.1.1.2 mstiIKJ Method Magazines shall be tested for tribcelectric US- the Faraday CUp Test in A3rpendix B. Identification Magazines that are treated with antistatic agents shall be identified as Ilantistat t r e a t e d t 1 by marking, embossing, printing, labeling, or other suitablemeans to prevent use of other similar but non-antistatic magazines where antistatic properti& are desired. They shall be mrkd with the manufacturerls name. L#t llumber or date of manufacture shall also appar (month and year, e.g., 12/86) 4.1.2 Resistivity Praperty 4.1.2.1 Material Fbqùmmmts Electrostatic shieldbq types shall: 1. Have a of less than 3 x 105 ckrms per meter of length, with the shielding surface not necessarily exposed, or 2. Have a shielding la er with a surface resistivity of AsTM-D-257 or equivalent, or otherwise determined, or less than 1 x lox akrms/square as wasured per E I A 541 88 m 3234b00 0074604 b m i EIA-541 Page 5 3. ve a VOIW resistivity of less than 1. O x lo3 ohmm per millht@r of thickness as measured per XT"D-991 or AS1M-D-257 as appropriate. N m : The values given abave are based upon a continuclszs shielding material and may vary for ~Mmed magazines or magazines with open areas. 4.1.2.2 I d e n t i f i ~ t i o n mese magazines shall be inclividually identified as %ÇD skiddingfo marking, embossing, printing, labeling, or other suitable means to prevent use of &er sinrilm bart mn-electmstatic shielding materials where electrostatic shielding properties m a n u f a w f s name. m rnrmber or date of are desi.red. They shall be marked with the 4.2 Bags and -ches ( N o n a o m ) 4.2.1 Antistatic materiale shall be evaluated for trikdectric chaqing us: G. As apprapriate additimal evaluation may ke ~ X C ~ Q Z - A E ~ wing C. O 4.2.1.2 Idmtzification Bags and puches that are treated with antistatic agents shall be individually identified as Ifantistat t r e a t e d 1 1 by marking, embsshg, printing, labeling or other suitable means to prevent use of other similar but non-antistatic bags and pauches where antistatic properties are desired. Antistatic materials shall be marked with the mnufacturerls name. rnrmber or date of manufacture shall also alJpear (mnth and year, e.g. , 12/86) o m e shielding layer shall be electrically eontimaus and shall conform to the criteria in paragraph 2.2.2.1 except that volume conductive materiab shall have a volume resistivity of EIA 541 B B W 3234b00 O074605 B W L EIA-541 . Page 6 A method for evaluating the relative prfomance of an electmstatic-shielding type finished is given in Appendh E. 4.2.2.2 Conductive Types 4.2.2.2.1 Material Require;ments Materials which are o d y surface conductive shall have a surface resistivity of less than accordance with ASI"b257 or equivalent. Volume conductive materials shall have a volume resistivity less than 1. O x 104 ahmm per millimeter of thicdcness &en measured in accordance with As?M-E991 or equivalent. 1.0 X 105 -1- &en measured in 4.2.2.3 Dissipative Types 4.2.2.3.1 Material Requirements Materials which a m only surface conductive shall have a surface resistivity of at least 1 okrmS/- when mesured in accordance with ASI"D-257 or equivalent. Volume coriiuctive materials shall hye a volume resistivity of at least 1.0 x 10 o l m l - c m . per lhter of millbter of thiw when meafllred in accordance with As?M-E991, or equivalent. X lo5 m less than 1 x 10 i? 4.2.2.4 Identification Electmstatic shielding, coactive, or dissipative types shall be individually identified as I1ESD respecrtively, by marking, embossing, printing, labeling, or other similar means where such properties are desirea in order to prevent use of other similar materials which do not have these prcrperties. Materials shall be marked with the mufacturer's name. I;ot nrrmber or date of manufacrture shall. also a- (month and year e.g., shielding", llconductivel~, or lldissipativetl, 12/86) . m E I A 541 88 W 3234b00 0074bOb T M -. P EIA-541 Page 7 static decay testing may also be perform3 as described in Appendix F. H c w w e r , Static decay testing is in addition t o t and not a substitute for, resistivity meammmnb or Faraday cbp Tests. Idmtffication sf this material shall be as specified in Paragraph 4 0 1 . L 2 , when inpracticable because of sane inherent. pmprty or configuration of the shall a- the material indicating its date of mufacture. m*id. In such cases, a certificate of cmpliance 4.3 .2 .1 El-btie Shidding Type (Used as an Enclosure Only) 4.3 .2 .1 .1 Naterial Rqxhments me electrostatic shielding performance of this material shall be evaluated according to ”ph 4.2.2.1.1. Materials which are only surface conductive shall have a surface resistivity of less than a c c o n with ASI”W257 or equivalent. Vduw conductive materials shall ve a volume resistivity of less than 1. O x 10 31” ohm-cm when measwed in accordance with --W991 or equivalent with the calculation based on the unmmpmssed thickness of the material. 1 . 0 x lo5 clhms/square when meafllred in EIA-541 Page 8 4.3.2.3 Dissipative Type 4.3.2.3.1 Material IWpimmnts Materials which are only surface conductive shall have a surface resistivity of at least 1 ohw/square when meafl;cred in accor-dance with ASTM-D-257 or equivalent. Voluw conductive materials shall have a volume resistivity of at m in accomwith m - E 9 9 1 or equivalent with the calculation based on the unccanp-sed thidmess of the material. X 105 ohms/- m t less than 1.0 X 10 i% 1.0 X lo4 ohm- k t ~CSS than 1.0 X 4 3.2.4 Identification Identification shall be the same as paragraph 4.2.2.4, except when inpracticable because of sane inherent property or configuration of the material. In such cases, a certificate of compliance shall acccanpany the material Mcating its date of marmfacrh;lre. 4.3.3.1 Testing Method Static decay testing may also be perfonred as described in m F. mer, static decay testing is in addition to, and & a substitute for, resistivity measurementS or Faraday Cup Tests. ' 4.3.3.2 Limitations See F, paragraph F3.0. 4.4.1.1 Material Requhamts llrese materials shall be evaluated as specified in C or D. 4.4.1.2 Identification Identification of this material shall be as specified in Paragraph 4.1. l. 2, except when impracticable because of scane inherent property or. configuration of the material. III such cases, a certificate of compliance shall acccPnpany the material indicating its date of mnufacture. EIA-541 Fage 9 mese material mqutmmnts shall be as qecified in Paragraph 4.3.2.1.1. mese xn&eri&S mpiremnts shall be as q ~ ~ f f i e d in Paragraph 4.3.2.2.1. Static decay testing may also be performed as described addition to, and not a substitute for, resistivity -ts or Faraday Cup Tests. inAppen&k F. Hawever , Static decay testing is in 4.4.3.2 Limitations 4.5.1.1 Material EkqwhmmtS EIA-541 . Page 10 4.5. l. 2 Identification Identification of this material shall be as specified in Paragraph 4 . 1.1.2, except when impracticable because of som inherent property or configuration of the material. III such cases, a certificate of compliance shall accmpany the material indicating its mufacture. 4.5.2 Resistivity praperty 4.5.2.1 Conductive Types 4.5.2.1.1 Material Requhmmb mese material nquhmmts shall specified in Paragraph 4.3.2.2.1. 4.5 2.2 Dissipkive T y p s 4.5.2.2.1 Matexial -ts These material z e q u i m m t s shall specified in Paragram 4.3.2.3.1. 4.5.2.3 Identification date of be be as as Identification of these materials shall be the same as Paragraph 4.2.2.4, acept when inpracticable because of inherent praperty or configuration of the material. In such cases, a certificate of conpliame shall acccgllpany the material indicating its date of manufacture. 4.6 Rigid Foams, Larye Molded, and other Similar Materials (All Types) Materials shall meet the requimrmts of 4.3 or 4.5 as appropriate. In sane applications, the central (or interior) part of the material may be expcwd or used. In these cases, it is amropriate to take specimens frcan both the skin and the interior to determine the electrid pmperties. 4.7 Carrier Foam, .Lead Insertion Foam 4.7.1 Antistatic Property 4.7.1.1 Material Reqdmmnts These materials shall be evaluated as specified in Apgmdix C or D. E I A 541 88 3234b00 0074b10 II 4.7.1.2 Identification EIA-541 Page 11 Identification of this materid shall be as specified in Rm~graph 4.1. l. 2, except when impracticable because of sane inherent property or configuration of the materia%. In such cases, a certificate of compliance -1 acxzcmpmy the anaterid indicating its date of mmufactmee 4.7.2 Resistivity 3?mprty Static decay testing may also be performed as described in F. H“, static decay testing is in addition to, and not a substitute for, resistivity -lx or Faraday Cup Tests. 4.7.3.2 Limitations EIA 541 B B m 3234600 0074bLL 3 m EIA-541 ' Page 12 Antistat, Antistatic Agent Antistatic property capacitance Carrier Qlarge Practical unit of el-cal curnent. One ampere of current is 6.24 x 10 electrons passing one point second: 1 A = 1 c/s. in one secod. oneampereequals onecaulcanbper A = a m p e r e c = CcRPlcanb S = second A chemical ccanpaund which, when impresMtea i n or topically applied to a primary material or substrate renders the primary material antistatic. This praperty refers to the pwention of triboelectric charge generation. It w i l l effectively minimize the production of a static charye when materials are separated frcgnamther surface. This pmrcrperty is not a depexfient function of material resistivity or of static decay performance. A preformed container made of flexible material generally enclosed on all sides except one which foms an c p n i ~ ~ ~ that may or may not be sealed after loading. It is m&ly constructed frcgn one piece of material that has been folded wer and sealed on two edges, or fm tubing sealed at one end. The ability of a CCBlTponent or material to store an electric charye. 'Ihe self-capzicitance of a charyed conductor is the ratio of its charye to its voltage (i.e., C = m) when all conductom are !the ratio aepenaS on the voltage of nearby conduhrs. Qpacitance is measured in units of farads. Since a farad is such avexy larye cpntity, its values are usually expressed in millionths of a farad, or microfarads, and millionths of millionths of a farad, or picofarads. Holder for elecrtronic parts and devices which facilitates handling during processing, production, inprinting, or t e s t i q aperations and protects such parts-transport. Meamred in caulcanbs or fractions t h m f . The static charge on a body is measured by the nmbr of separated electmns on thebody. Sincenet charye cannot be created or destmyed, an electron remved frcgn one bodty must go to anather body, leaving behind a positive (+) void. Thus, there are always equal and apposite c;harges P&&. EIA 543 88 m 3234600 0074632 5 m Electron EIA-541 Page 13 A surfam =khat is eleckically confiuctive in that mrrent can be passed as the result of an applied voltage between any .two points on its Mysical surface and when discontinuities, slots, or holes do not mxpy more than 10% of the materialls surface. - . E I A 541 88 m 3234b00 0074613 7 W EIA-541 Mge 14 EMI Faraday Cage Ground Grounding Abbrwiation for eleckmmgnetic interference. sources sparks, lightning, radar, radio andm transmission, brush motors, line transients, etc. A spark fram a static disdmge is a source of EMI. By line conduction or air prcrpagation, can inauce undesirable voltage signals in electronic @ p t causing malfunction and occasionally canpnent damage. Protection against ElMI usually requires the use of shields, filters, and special cimxit design. E l e c t r i c a l energy is measured in watt-seconds or joules. Sam semico&ctors can bedamgedbya static discharge of less than one microjoule. E l W t a t i relations d / 2 , = or w/2. is calculated from the An electrically continucus, conductive enclosure which pravides electrostatic shielding; that is, a region of m electmstatic field. The cage or shield is usually gmunded, although it need not be. A metallic connection w i t h the earth to establish zero potential or voltage- w i t h respect to graund or earth. It is the voltage reference point in a connection to earth, but it is understood that a point in the circuit said to be at grCrund potential could be mnnected t o e a r t h w i t h o u t disturbingthe aperation of the circuit in any way. circuit. There may or may ncrt be an actual Graunds that can be used for’ static control work stations include metal, water pipes, any pawer graund, any large metal structural member of a building, vessel hull, etc. cbnnecrting to groclnd or to a cm3uctor that is grrxuded. A meahã of referencing all conductive &jects to a zero voltage equiputential surface. This is the surest method of eliminating ESD since eveqthing is maintained a t the same potential. Insulator A material that is a poor conductor of electricity. Inthte Packagirq mose materials in direct contact w i t h the item Material Packaged. Ionization !the process by which a neutral atam or molecule, such as air, acquires a positive or negative -e* e Nonconductor O h EIA-541 Page 15 Those pxzkagim~ mterials that do not cam in packaged , or a m autsi
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